PNA X有没有办法在常规马刺上执行扫描IMD类型测量？

您可以使用标准通道和FOM执行此操作。
我建议您首先设置一个标准通道，覆盖测量所需的所有源和接收器频率（如果RF和IF频率之间存在较大的频率间隔，请使用段）。
在打开FOM并配置特定的源和接收器范围之前，请对用于测量的两个端口执行引导功率校准。
完成此校准后，将校准所有源和接收器的电源。
此时，您可以使用FOM将源和接收器扫描配置到您想要的任何范围并测量任何杂散（只要它的频率落在您校准的范围内）。
此时，您还可以复制此主通道，以便在不必重复校准的情况下对不同的杂散进行测量。



     以下为原文

  You can do that with the standard channel and FOM.  I would recommend that you first setup a standard channel that covers all the source and receiver frequencies you need for your measurement (use segments if there is a big frequency gap between the RF and IF frequencies).  before turning on FOM and configuring the specific source and receiver ranges, perform a guided power calibration for the two ports you are using for your measurement.  once this calibration is done, all your sources and receivers will be calibrated for power.  at this point you can use FOM to configure the source and receiver sweeps to whatever range you want and measure any spur (as long as it's frequency falls in the range you calibrated).  you can also at this point make copies of this master channel to make measurements of different spurs without having to repeat the calibration.

嗨Joel博士，我尝试了你描述的smc方法，它似乎工作！
我附上了pdf图。
一种是在3个输入rf输入激励点使用imdx通道进行测量，而另一种是整个波段的smc方法。
结果似乎在1 dB之内。
我的后续问题是是否有一种方法可以翻转频率轴，使得较低的频率从左侧开始，而不是如图中所示的右侧。
（因为我正在研究的是-RF + 5LO，它可以翻转周围的一切）作为旁注，我认为安捷伦可以推广这一功能，类似于他们宣传扫描imd / x测量的方式。
开发团队可以创建另一种类型的测量类（即扫描转换器杂散），您可以在其中链接到预先存在的参考smc通道以继承大多数设置（即RF功率和频率范围以及LO设置）。
这样，您可以创建另一种提供dBc读数的跟踪类型，而无需使用公式编辑器，也可以根据上述问题调整频率轴。
此外，通过链接到多个杂散的参考smc通道，您可以通过更改参考smc通道更轻松地调整RF功率级别，而不必像使用IM Spectrum转换器那样更改每个杂散通道
测量通道。
韩国
01_18_2013（刺激样本）.pdf25.3 KB



     以下为原文

  Hi Dr Joel,

I tried the smc method you described and it seems to work! I attached the pdf plots. One is taking the measurement using an imdx channel at 3 input rf input stimulus points, while the other is the smc method for the entire band. The results seem to be within 1 dB of each other. My follow-up question is whether there is a way to flip the frequency axis such that the lower frequency starts on the left hand side, instead of the right hand side as shown in the plots. (because the spur I'm looking at is -RF + 5LO, which flips everything around)

As a side note, I think Agilent can market this feature similar to how they are touting the swept imd/x measurement. The development team can create another type of measurement class (i.e. swept converter spurious), where you can link to a pre-existing reference smc channel to inherit most of the settings (i.e. RF power and frequency range and LO settings). That way, you can create another trace type that offers the dBc reading without having to hassle with using the equation editor and also can adjust the frequency axis based on the problem described above. Also, by linking to a reference smc channel for multiple spurs, you can adjust the RF power level easier by just changing the reference smc channel, rather than having to change each and every spurious channel, as is the case when using the IM Spectrum converters measurement channels. 

rok

附件

• 01_18_2013(imdx spur sample).pdf46.9 KB
  
• 01_18_2013(spur sample).pdf25.3 KB