DSP 28027F 开发板 XDS100v2调试探针诊断日志显示了 Error -150 (SC_ERR_FTDI_FAIL)如何解决

开发板正常连接后通过Test Connectionh】后，我的ccs12.4.0 连接不上开发板尝试了很多方法（调整jtag速率、换一个开发板、换usb线等方法），但无法解决，请问大佬们，有何见解
文字日志如下：
[Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\IHAOST1\AppData\Local\TEXASI1
CCS\ccs1240\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jun 2 2023'.
The library build time was '12:47:07'.
The library package version is '9.12.0.00150'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The JTAG IR instruction path-length was not recorded.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0

-----[An error has occurred and this utility has aborted]--------------------

This error is generated by TI's USCIF driver or utilities.

The value is '-150' (0xffffff6a).
The title is 'SC_ERR_FTDI_FAIL'.

The explanation is:
One of the FTDI driver functions used during
configuration returned a invalid status or an error.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]