SP605评估板外部存储器测试失败

大家好，
我正在使用SP605评估板，我遇到了BIST的问题。
外部存储器测试（我估计DDR3存储器）经常失败，并且大多数情况下，当它到达通过B（禁用I和D缓存）时发生。
我收到了以下错误消息：
错误＃1：地址= 0x56B8F8D0，数据预期为0xFFFFFFFF，数据接收为0xA5A5A5A5
ERROR＃2：地址= 0x56B8F8D4，数据预期为0xFFFFFFFF，数据接收为0xA5A5A5A5
我收到大约3000条错误消息，比如这些消息。
问题是测试并不总是在同一地址崩溃，并不总是在测试的同一阶段，有时它工作正常......
你有遇到过这种问题吗？
你认为我的电路板/存储器被破坏了吗？
提前致谢，
垫



以下为原文

Hello everybody,

I'm using a SP605 evaluation board, and I'm facing a problem with the BIST. The external memory test (DDR3 memory I guess) fails very often, and most of the times, it occurs when it reaches pass B (both I and D caches disabled).
I got these error messages :
ERROR #1: Address = 0x56B8F8D0, Data Expected was 0xFFFFFFFF, Data Received was 0xA5A5A5A5
ERROR #2: Address = 0x56B8F8D4, Data Expected was 0xFFFFFFFF, Data Received was 0xA5A5A5A5
I receive about 3000 error messages like these ones.

The problem is that the test doesn't always crashes at the same address, not always at the same stage of test, and sometimes it works fine...

Have you ever faced this kind of problem ? Do you think my board / memory is spoiled ?.

Thanks in advance,

mat