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我有一个表存储在STK14CA8N25VSRAM的一部分中。该表在产品寿命开始时首次在生产线上存储。该表不应该在单元生命周期中更新。表中的每一个电源都是从存储器读取的,并由产品功能使用。
不幸的是,在几个单位中,桌子被打乱了,在随机的地方,很少的位会从“0”变为“1”。(内存NAS不擦除或“翻转”,只是在一些随机位中中断)。 这听起来非常类似于在15159中描述的单点翻转(SEU),但是它发生得太频繁了。 你在NVSRAM设备之前见过这种现象吗?你有没有解决如何解决这个内存中断的问题? 以上来自于百度翻译 以下为原文 I have a table stored in part of the STK14CA8-N25I nvSRAM. This table is stored first time at the production line at the begining of the product life. The table is NOT supposed to be updated during the unit life cycle. Every power-up the table is being read from the memory and used by the product functionality. Unfortunately, in several units the table was disrupted and few bits, in random places, changes their value from '0' to '1'. (The memory nas NOT erased or "run over", just disrupted in some random bits). It sounds very similar to the Single Enent Upset (SEU) described in AN15979 but it occurs too much frequent. Have you meet this phenomena before in nvSRAM devices ? do you have recomandations how to solve this memory disruption ? |
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嗨,Ddtt,
诸如SU/SEL等软错误在所有SRAM产品中非常普遍,因此它也影响NVSRAM,因为NVSRAM也由SRAM单元组成。赛普拉斯NVSRAM还提供了一个特殊的功能称为软件召回,可以用来消除软错误的问题。在电源关闭期间,NVSRAM将数据存储到NV单元中,并在加电期间将数据召回到SRAM中。如果该设备仅用于读取(如在应用程序中),那么它将始终具有NV单元中的SRAM数据的副本。如果SRAM单元中的数据被损坏,软件召回可以将数据恢复回SRAM。 希望这对你有帮助。 -什文德拉 以上来自于百度翻译 以下为原文 Hi Ddtt, The soft errors such as SEU/SEL are very common across all SRAM products and thus it affects the nvSRAM as well since nvSRAM also consists of SRAM cell. Cypress nvSRAM also offers a special feature called Software Recall which can be utilized to do away with soft error issue. The nvSRAM stores data into NV cell during power off and recall the data into SRAM during power up. If the device is used only for read ( as in your application) then it will always have a copy of SRAM data in the NV cell. In case if data is corrupted in SRAM cell, software Recall can restore data back to SRAM. Hope this helps you. -Shivendra |
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