S25FL256L在未知时间错误后没有响应

你好，
你用什么命令阅读制造商ID？请注意，S25FL256L支持0x9F命令，但不支持0x90命令。
请告诉我们设备没有响应哪个命令。
谢谢，
智



     以下为原文
  Hi,
 
What command did you use to read the manufacturer ID? Note that S25FL256L supports the 0x9F command, but not the 0x90 command.
 
Please let us know to which command the device did not respond.
 
Thanks,
Zhi

嘿，
谢谢你的回复。
我使用了0x9F命令，我已经有一个工作板，其中S25FL256L以正确的制造商ID响应。
这里的问题是，我们有几个板，闪存不再响应，我们没有看到任何原因，这可能会发生。
改变电路板上的闪存IC解决了问题，但是我们需要找出导致这个错误的原因。
谢谢，
安德烈



     以下为原文
  Hey,
 
thanks for the Reply.
I used the 0x9f command and i already have a working board where the S25FL256L responds with the correct manufacturer ID.
 
The issue here is that we have a few boards where the Flash is not responding anymore and we don't see any reason why this could happen.
Changing the Flash ic on the board fixes the Problem, but we Need to find out what causes this error.
 
Thanks,
Andre

嗨，安德烈，
我的理解是，一个新的FL256L设备将工作良好，但它可能会变得没有反应后一段时间。对吗？
在FLASH坏之前执行哪些操作？你在做电源循环测试吗？
谢谢，
智



     以下为原文
  Hi Andre,
 
My understanding is that a new FL256L device would work fine, but it may become not responding some time after. Is that right?
 
What kinds of operations are performed on the flash before it became bad? Were you doing some power cycle testing?
 
Thanks,
Zhi

嗨，Zhi，
是的，你的理解是正确的。
目前，所有正在执行的都是在硬件上进行以下操作：
1。启用QuadMode（WREN（0x06）和WRR（0x01））
2。更新Adress（WREN（0x06）和WRAR（0x71））
三。四输出读出（0x6C）
在初始化之后，Flash目前不被我们的软件使用。
我做了一个测试，我在这个循环中进行了8个多小时的初始化，以检查这个init是否以某种方式崩溃了，但是这并没有损坏它。



     以下为原文
  Hi Zhi,
 
yes your understanding is correct.
 
At the Moment, all that is being performed is the following at power up the Hardware:
1. Enable QuadMode ( WREN(0x06) and WRR(0x01) )
2. Update Adressing ( WREN(0x06) and WRAR(0x71) )
3. Quad Output Read ( 0x6c)
 
After this initialization the Flash is currently not used by our Software.
 
I performed an test, where i did this initialization in a Loop for more than 8 hours to check if this init crashes the Flash somehow, but this did not damage it.

嗨，安德烈，
我懂了。谢谢你的解释。
我认为这KBA（知识库文章）可能会感兴趣：在串行NOR闪存设备写寄存器（WRR）操作期间的功率损失--KBA221246
串行NOR闪存器件写寄存器（WRR）操作期间的功率损失
也许在您以前的测试中，一些设备在WRR操作期间失去电源，导致一些非易失性寄存器中的损坏。在你的软件中，你要尽量减少潜在的破坏窗口。我们建议软件首先读取寄存器值，将它们与期望值进行比较，如果值不同，仅WRR，通常在这种实现之后，不应该有任何寄存器损坏，因为在大多数软件应用中没有频繁的WRR操作。
希望KBA和App Note（ANS2002）在KBA内部引用会对你有所帮助。
谢谢，
智



     以下为原文
  Hi Andre,
 
I see. Thanks for explaining.
 
I think this KBA (Knowledge Base Articles) may interest you: Power Loss During the Write Register (WRR) Operation in Serial NOR Flash Devices – KBA221246
Power Loss During the Write Register (WRR) Operation in Serial NOR Flash Devices – KBA221246
 
Perhaps in your previous tests, some devices lost power during the WRR operation, resulting in corruptions in some non-volatile registers. It is important that in your software, you want to minimize the windows of potential corruptions. We suggest that the software reads the register values first, compares them with the desired values, only does WRR if values are different, Usually after this implementation, there should not be any register corruptions because there are no frequent WRR operations in most software applications.
 
Hope the KBA and the App Note (AN200381) quoted inside the KBA will help you.
 
Thanks,
Zhi