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MCKIT - 需要单个分流方法的更详细说明/文档
以上来自于谷歌翻译 以下为原文 MCKIT - more detailed explanation / documentation for single shunt method required |
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Ciao Tobias,
在STM32 FOC lib中实现的单分流电流读取方法。 ST已获得专利,并且代码的相关支持必须遵循标准的ST程序。这意味着您必须联系最近的ST销售办事处或支持团队。 哪个是您的经销商 - 地理位置? 再见 梁咏琪 以上来自于谷歌翻译 以下为原文 Ciao Tobias, the single shunt current reading method implemented in the STM32 FOC lib. 2.0 has been patented by ST and the related support on the code must follow the standard ST procedure. This means that you have to contact the most near ST sales office or support team. Which is your distributor - geographic location? Ciao Gigi |
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我基本上不想实现包括失真特征在内的专利软件。我想了解在整个PWM周期期间如何测量电流两次的原理。 (我不需要在''复杂的扇区/边界中进行当前测量)。
如果有人能够解释两次pwm循环触发/重新触发ADC1注入的原理,我会很高兴。 据我所知,ADC1的注入通道用于在整个PWM周期内测量两次分流电压。 基本上我看到CC4事件触发注入的通道,但理论上第一次测量应该有一个CC4事件,第二次测量应该有一个CC4事件。 有人能告诉我如何启用第一次注入的触发器,以及如何再次设置第二次测量的触发器? 非常感谢! 以上来自于谷歌翻译 以下为原文 I basically don't want to implement the patented software including the distortion-feature. I'd just like to understand the principle of how to measure the current twice, during on complete PWM cycle. (I don't need the current measurement in ''complicated sectors / boundarys). I'd be glad if someone could explane the principle of triggering / retriggering the ADC1-injection twice a pwm cycle. As I understand ADC1's injected channel is used to measure the shunt voltage twice during on complete PWM period. Basically I see the CC4-event triggers the injected channel, but in theory there should be a CC4-Event for the first measurement, and one for the second. Can someone tell me how to enable the first injected trigger, and the how to set the trigger for the second measurement again? thanks a lot! |
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Ciao Tobias。
为了在边界区域外执行双采样,MC库中应用的原理是DMA事务在运行时改变TIM1的第四个通道的输出比较寄存器(用作ADC触发)。该DMA事件由输出比较寄存器与定时器计数器的第一次匹配触发。通过这种方式,可以在第一次匹配时产生一些小故障(能够触发第一次采样),在第二次匹配时产生第二次触发。 我希望这些信息有用 再见 梁咏琪 以上来自于谷歌翻译 以下为原文 Ciao Tobias. To perform the dual sampling outside the boundary zone the principle applied in the MC library is that a DMA transaction change on the fly the output compare register of the fourth channel of TIM1 (used as ADC triggering). This DMA event is triggered by first match of output compare register with timer counter. In this way is possible to generate a little glitch (able to trigger the first sampling) on first match and a second trigger on second match. I hope that this information can be useful Ciao Gigi |
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