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大家好,我正在尝试使用E5071C ENA来表征电容器件。
我们在电缆末端执行OSL校准,然后使用损耗补偿在特征板上使用SHORT进行端口扩展。 当我使用300 kHz至3 GHz的频率范围进行测量时,预期的Q值低于预期值,特别是在较低频率下。 当我使用较窄的跨度进行测量时,我可以看到Q值更高。 我可以看到损耗补偿只测量了2个频率(查看CALIBRAtiON / PORT EXTENSION菜单中的相应子菜单)。 问题:1.-为什么我在全跨度测量和较窄跨度测量之间有如此不同的结果? 2.-是否有任何方法可以校准全跨度中更多点的损耗? 3.-规范化可以帮助吗? 请找到附带结果的情节。 任何提示都会非常感激,提前谢谢GuiX 以上来自于谷歌翻译 以下为原文 Hi everybody, I am trying to characterize a capacitive device using an E5071C ENA. We perform a OSL calibration at the end of the cables and then port extension using a SHORT on the characterization board using the loss compensation. When I do measurements using the frequency span from 300 kHz to 3 GHz, the expected Q value is lower than expected, specially in the lower frequencies. When I do measurements using narrower span, I can see that the Q value is higher. I can see that the loss compensation is measured for only 2 frequencies (looking at the corresponding sub-menu in the CALIBRATION/PORT EXTENSION menu). Questions: 1.- Why I have so different results between the full span measurements and the narrower span measurements? 2.- Is it any method to calibrate the loss for more points in the full span? 3.- Could normalization help? Please find attache a plot of the results. Any hint will be really appreciated Thank you in advance GuiX 附件
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更多数据。
使用85093-60010电子校准模块完成校准。 有没有人可以支持我? 以上来自于谷歌翻译 以下为原文 Some more data. The calibration is done using a 85093-60010 Electronic calibration module. Is there any one that can support me? |
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我最近买了一个类似的VNA(E5071B 4端口),我正在使用N4431B 60006 Ecal模块。 虽然我多年来一直在使用这些分析仪,但这是我第一次尝试使用端口扩展功能,而不是在PE菜单中添加延迟时间。 我最初尝试在PE菜单中使用损耗补偿时,在测试LF到几GHz的小值电容时会产生非常混乱的结果。 我没有得到我期望的ESR配置文件,我认为我正在使用此功能。 所以现在我已经回到在RF模拟器中添加端口扩展,因为我可以生成我最常用的端口扩展的相当准确的2端口模型。 还有一个夹具补偿菜单,我打算在某些时候进行探索,看起来它可以在分析仪本身内实现同样的东西。但是目前我有点懒,并且正在进行PE / de嵌入 模拟器。 编辑:G0HZU于2015年11月19日下午2:53编辑:G0HZU于2015年11月19日下午2:55 以上来自于谷歌翻译 以下为原文 I've recently bought a similar VNA (E5071B 4 port) and I'm using the N4431B 60006 Ecal module. Although I've been using these analysers for many years at work this is the first time I've tried to use the port extension feature beyond adding a delay time in the PE menu. My initial attempts to use the loss compensation in the PE menu have produced very confusing results when testing small value capacitors across LF through to a few GHz. I don't get the ESR profile I expect and I think I'm using this feature incorrectly. So for now I've gone back to adding the port extension in an RF simulator as I can produce a fairly accurate 2 port model of the port extension that I most commonly use. There is also a fixture compensation menu that I intend to explore at some point that looks like it can achieve the same thing within the analyser itself.. But at the moment I'm being a bit lazy and doing the PE/de embedding in a simulator. Edited by: G0HZU on Nov 19, 2015 2:53 PM Edited by: G0HZU on Nov 19, 2015 2:55 PM |
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