85054D端反射系数超过1

对于精确型测量，您必须使8720处于步进扫描模式。
看看是否有所作为。
另外，当你说大于1时，它是1.0001还是1.1 ?,换句话说，它有多远。
（最好只看一下以dB为单位的S11）。
你测试过测试电缆的稳定性了吗？



     以下为原文

  For precision type measurements, you have to have the 8720 in stepped sweep mode.  See if that makes a difference. 

Also, when you say greater than 1, is it 1.0001 or 1.1?, in other words, how far off is it. (best just look at S11 in dB).  And did you test the stability of the test cables?

测试端口电缆始终小心锁定在一个位置。
这样我总是尽量减少测试端口电缆可能导致的错误。
我们讲的是1.001到1.003级别。
我今天发现有趣的事情，如果做VNA 1端口测量校准订单Load，Open和Short。
在此之后，当我测量DUT的开路和短路结果低于1并且遵循8510和8720的精确多项值时。如果测量校准按顺序打开，短路和负载则开路/短路测量看起来更糟。
有趣的是，标准连接顺序对DUT的结果非常重要..至少8720系列分析仪。编辑：bar28于2016年2月10日上午8:43



     以下为原文

  Test port cable is always locked carefully on one position. That way I always trying to minimize errors what test port cable can cause. We speaking about 1.001 to 1.003 level. I found interesting thing today, that if doing VNA 1-port measurement calibration an order Load, Open and Short. After that when I'm measuring DUT's open and Short results are below 1 and following nicely polynomical values with 8510 and 8720. If measurement calibration is done on order Open, Short and Load then Open/Short measurements looks worse. Interesting thing, but standards connection order really matters on DUT's results..at least with 8720 series analyzers.

Edited by: bar28 on Feb 10, 2016 8:43 AM

我不能真正相信连接顺序会产生差异，除了可能会有一些轻微的加热或采取数据的其他影响，因此不同的顺序有不同的加热效果。
另一个原因可能是连接器的可重复性。
也许标准的连接可重复性存在差异。
为了测试这个：应用标准，将数据设置到内存和数据减去内存。
数据应降至-60到-80 dB之间。
然后断开并重新连接标准。
你看到的是连接器的可重复性。
同时将标准旋转90,180,270度，以查看是否存在偏心效应。
看一个标准是否比其他标准更差。



     以下为原文

  I can't really believe the connection order causes a difference, except that perhaps there is some slight heating or other effect from taking the data and so the different order has different heating effect.  Another cause could be connector repeatability.  Perhaps there is a difference in the connection repeatability of the standards.  For testing this: apply a standard, set data into memory and data minus memory.  The data should drop to something like -60 to -80 dB. Then disconnect and reconnect the standard.  What you see will be the connector repeatability. Also rotate the standard by 90,180,270 degrees from the first connection to see if there is some off-center effect.  See if one standard is worse than the others.

嗨，我根本不使用固件校准。
瑞士METAS对所有校准标准进行了单独的测试，并且更准确的数据库值取代了多项数据。
因此，每个标准（开放，短期和负载）我已经认可/可追溯的结果，其中也考虑了连接器效率。
VNA-Tools II不受分析仪本身的影响，因为它只是测量原始数据。
程序内部发生错误计算，并且所有操作都在该方面正确完成。
甚至testport适配器pin-deptsh也被Keysight调整到了回避方面，避免了近场效应。
一切都非常谨慎。
因此，我假设在这种情况下，高反射分量幅度的这个小错误现在必须来自我的VNA盒子。
我之前也听说过，有人提到校准标准连接顺序会对某些VNA盒行为产生影响。
也许今天的ENA和PNA有更好的架构，订单没有任何影响这里是8722ES的规格。
所有的错误都在不确定的情况下仍然很好。编辑：bar28于2016年2月10日上午10:42



     以下为原文

  Hi,

I'm not using firmware calibration at all. All calibration standards are individualy characerized by Swiss METAS and polynomical data is replaced by more accurate database values. So each standards (Open, Short and Load) I have accreditated/traceable results where has taken account connector effetcs too. VNA-Tools II is immune to analyzer itself, because it just measuring the Raw-data. Error calculation happening inside the program and all is done correctly on that side. Even testport adapters pin-deptsh are adjusted by Keysight enought to recression side avoiding the near field effect. All is done very carefully. So my assume on this case is , that this tiny error on high reflect components magnitude must come now mostly from my VNA box. I have heard before too, that someone else has mentioned that calibration standards connection orders can have own effect on some VNA boxes behavings. Maybe today's ENA's and PNA's has better architecture where order not have any effects

Here is specs from 8722ES. All errors goes still nicely inside the uncertainty.

Edited by: bar28 on Feb 10, 2016 10:42 AM

附件

• Sieppaa.PNG103.9 KB
  

考虑到这一点，也许它是一个偏心导体，例如，如果负载使导体处于中心位置，然后你打开并短路，而开路使其偏离中心，则短路可能会有不同的
测量。
但是，如果没有高功率或附加偏差，我从未听说过标准订单会产生任何影响。



     以下为原文

  In thinking about this, perhaps it is an off-center conductor for example, if the load makes the conductor on-center, and then you do open and short, and the open makes it off-center, then the short might have a different measurement.  But I never heard of standard order making any difference if there is not high power, or bias attached.

我同意你的看法，我也完全相同。
好吧，我现在找不到真正的事实为什么它表现得这么好。
我使用7mm 85050B calkit重复测量，同样的效果也可以看到它。
我很高兴，现在在Load-Open-Short订单上运行良好。
在基因方面，我总是试图同时测量相似类型的组件，而不是在测量过程中混合它们。



     以下为原文

  I agree with you and I thought totally same things too. Well, I can't find now true fact why It behaves such a way. I repeated measurements using the 7mm 85050B calkit and same effect can see it too. I'm happy, that all working well now on Load-Open-Short order. In genetally I always trying to measure similar type of components at the same time and not mixing them during the measurement process.