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The atomic force microscope (AFM) is capable of imaging insulating materials with atomic resolution, including many properties of polymers as well as surface structure, including friction, adhesion, and visco elasticity. All of these measurements can be done without damaging preparative processes, such as metallic coating or placement in vacuums, which are common with many other analytical techniques.
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关于Keysight x1149 Boundary Scan Analyzer
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N5230C用“CALC:MARK:BWID？”获取Bwid,Cent,Q,Loss失败，请问大佬们怎么解决呀
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