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我们购买了E4980A LCR仪表。 当测量1 kHz至180 kHz频率的阻抗和相移时,某些固定频率的性能会有相当大的波动。 在其他频率的同时,参数是稳定的。 我们不使用平均值并实时进行测量。 我们使用自动范围。 我们的研究设备具有以下特性(可靠地知道):1。容量为22 pF 2.直流电阻约为10 ^ 13欧姆在设备的测量中:1。容量为22 pF 2.电感为200 mH 3.阻抗为100 kOhms至10 MOhms(随频率降低)4。电阻随频率变化而变得小于0.感谢您的信息。 以上来自于谷歌翻译 以下为原文 Hello! We purchased E4980A LCR meter. When measuring the impedance and phase shift at frequencies from 1 kHz to 180 kHz, there is considerable fluctuation in the performance of certain fixed frequencies. At the same time at other frequencies, the parameters are stable. We do not use averaging and make measurements in real time. We use the automatic range. Our investigational device has the following characteristics (reliably known): 1. capacity of 22 pF 2. The dc resistance of the order of 10 ^ 13 Ohm In the measurement of the device: 1. capacity of 22 pF 2. inductance of 200 mH 3. impedance of 100 kOhms to 10 MOhms (decreases with frequency) 4. resistance varies with frequency and becomes less than 0. Thanks for You information. |
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嗨,我也有一些关于使用E4980A测量低阻抗部件的问题。
我们正在测量一个6.8uH P7614电感器,它被指定为100kHz / 250mV信号源。 我们从规格的低端获得读数,大约为5uH。 我们注意到即使ALC打开,信号源也会从250mV显着下降到8mV。 我们尝试了其他电感器(不同的部件号)并获得了相同的结果。 在较高频率下不是这种情况(在1MHz时,信号源不会下降)。 鉴于信号源无法调节,我们想知道“电感”读数是否仍然有效,并且与在精确信号源读取时相同? 如果没有,预期的错误是什么? 这是否也适用于可测量仪器的电容器或其他无源器件? 希望安捷伦也能对此有所了解。 谢谢,NianEdited:nian29于2012年4月25日上午2:01 以上来自于谷歌翻译 以下为原文 Hi, I also have some questions on measuring parts at low impedances using the E4980A. We are measuring a 6.8uH P7614 inductor which is specified to 100kHz/250mV signal source. We are getting readings from the low end of the specification, at around 5uH. We noticed that the signal source significantly dropped from 250mV to 8mV, even when ALC is on. We tried other inductors (different part number) and is getting the same results. This is not the case at higher frequencies (at 1MHz, the signal source does not go down). Given that the signal source cannot be regulated, we want to know if the "Inductance" reading is still valid and would be the same as if read at the exact signal source? or if not, what is the expected error? Does this also applies to capacitors or other passive devices measurable to the instrument? Hope Agilent can also put a light on this. Thanks, Nian Edited by: nian29 on Apr 25, 2012 2:01 AM |
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