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大家好,到目前为止,大多数关于ict的测试都是回流焊接,没有THT组件。
在未来更多的电路板我必须测试ict有许多THT元件也是波焊。 这对我来说是一个新的挑战! 什么是预防,减少接触问题的常用解决方案? 谢谢你的回应 以上来自于谷歌翻译 以下为原文 Hi all, until now most boards test on ict are reflow soldered only, without THT components. In future more boards i have to test on ict have many THT componets also and are wave soldered. This is a new challenge for me! What are usual solutions for prevent, reduce contact problems? Thanks for responds |
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我想你的波浪中存在相当大的磁通污染 - 如果这个问题非常关键,那么这是在选定的区域还是“全部”,你可以查看你的流程同事是否有更多“测试友好”的通量 -
他们还可以考虑修改载体,以便为不需要波焊接的tstpoints提供更多保护,确保你有一个良好的真空动作(良好的捕捉),联系你当地的夹具代表 - 他们可以推荐更高的力探针,更锋利的提示 对于测试点 - 同时也增加了夹具维护计划并每隔4-8小时清洁夹具探针,使用符合ESD标准的非线刷,并且还在3070的测试计划中使用IYET功能,这样可以仅在模拟部分重新进行夹具和重新测试 如果所有这些仍然失败,那些边际失败,操作员将需要在测试前清理板..希望这有帮助! 以上来自于谷歌翻译 以下为原文 I guess you have quite an aggressive flux contamination from the wave - is this in selected areas or 'all over' if the problem is really critical, you can review if there is a more ';test friendly' flux available with your process colleagues - they could also looked at modifying carriers to give more protection to tstpoints that dont need wave soldered for fixturing, make sure you have a good vaccum action (good snap), contact your local fixture rep - they can recommend higher force probes, with sharper tips for testpoints - asnd also increase the fixture maintanance schedule and clean the fixture probes every 4-8 hours with ESD compliant, non wire brush and also utilise the IYET feature in testplan of 3070, this allows recycle of fixture and retest in analog section on only those marginal fails if all this is still failing, operator will need to clean board before test.. hope this is helping ! |
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