[问答]

测量设置中加入AFS4-00102650-35-10P-4校准后出现尖峰

问答对人有帮助，内容完整，我也想知道答案 0 问候，我试图在我的测量设置中加入AFS4-00102650-35-10P-4，但是在校准后我看到一些有趣的尖峰（见附件）。这些尖峰来自何处？谢谢，KA P.S。：我通过设置适当的源功率水平确保我没有超载分析仪接收器。以上来自于谷歌翻译以下为原文 Greetings, I tried to incorporate AFS4-00102650-35-10P-4 in my measurement setup, but I see some funny spikes after calibration (see the attachment). Where so these spikes come from? Thanks, KA P.S.: I made sure that I am not overloading the analyzer receiver by setting the appropriate source power level. 附件 Spikes_BK_Precision_09242015.bmp2.3 MB 0
2018-10-22 16:17:28　　评论淘帖0 邀请回答您可以邀请以下用户，快速回答问题 × kingnet_52040 该类别下有 195 个回答。邀请回答 60user7 该类别下有 81 个回答。邀请回答蓝色冰汐该类别下有 45 个回答。邀请回答醉狼工作室该类别下有 41 个回答。邀请回答 ianwhoani 该类别下有 30 个回答。邀请回答 dkhwakd 该类别下有 25 个回答。邀请回答 aaabbb567 该类别下有 23 个回答。邀请回答 e08506806 该类别下有 20 个回答。邀请回答 szzjfyp 该类别下有 18 个回答。邀请回答 sonia87 该类别下有 16 个回答。邀请回答 ningee 该类别下有 16 个回答。邀请回答 xj5548 该类别下有 15 个回答。邀请回答 zouqinxiang 该类别下有 15 个回答。邀请回答 daichuangs 该类别下有 14 个回答。邀请回答 derek88 该类别下有 14 个回答。邀请回答 hzmbs2016 该类别下有 12 个回答。邀请回答 JST2006 该类别下有 12 个回答。邀请回答 hu_wflllllllg21 该类别下有 11 个回答。邀请回答 fichesw 该类别下有 11 个回答。邀请回答 www037 该类别下有 11 个回答。邀请回答举报李秀珍相关推荐 • 请问STM32F030F4P6 VREFINT校准的准确性如何？ 222 • 采用AD5933进行阻抗测量，测量计算后的阻值会随实际值增大而增大的原因？ 428 • QSYS中加入EPCS控制器后的警告问题 10700 • STM32F4如何进行自动ADC校准 ? 798 • 测量短路时导致这些尖峰的原因是什么？ 886 • 使用AD7793,测量mv电压，增益设置为4后，计算出测量结果相差很大，请问是增益有问题吗 4070 • 有关N5230C 4端口PNA校准的问题 2248 • 【求助】labview图像显示中加入标签的问题 3473 • 如何在cadence中加入中文丝印 6843 • 请问单片机如何向MDK中加入头文件和库文件？ 670 2个回答

答案对人有帮助，有参考价值 0 AFS4-00102650-35-10P-4似乎是一个LNA，从您的图片看起来您正在进行1端口校正回波损耗测量（S44）。假设您将LNA的输出端口连接到端口4并且输入端口连接到分析仪的端口1或端口2并且您已使用FOM打开输入端口上的源并扫描时，我是否正确你测量S44的频率是多少？那么基本上，你是否对LNA的输出进行了“热匹配”测量？如果我的假设是正确的并且您正在测量热S44，那么spkies就在那里，因为您已将输入源频率设置为与S44测量的频率相同。除非您的PNA-X上有NVNA（X参数）选项，否则在进行热匹配测量时，您必须将源频率偏离S参数频率，以使放大器的输出信号不在同一范围内。带宽作为小信号S参数测量。附加的电源点是我们在会议上提供的研讨会的一部分，并描述了在PNA-X上设置热S参数测量的正确方法（我还假设您正在使用的是VNA）。当然，如果所有这些假设都不正确，那么您需要提供有关测量设置的更多细节，以便我们能够对尖峰进行评论。以上来自于谷歌翻译以下为原文 AFS4-00102650-35-10P-4 appears to be an LNA and from your picture it looks like you are making a 1-port corrected return loss measurement (S44). Am I correct in assuming that you connected the output port of the LNA to port 4 and the input port is connected to either port 1 or port 2 of the analyzer and you have used FOM to turn on the source on the input port and sweeping at the same frequencies that you are measuring S44 over? So essentially, ar you making a "Hot Match" measurement on the output of the LNA? If my assumptions are correct and you are measuring a hot S44, the spkies are there because you have set the input source frequencies to be the same as the frequencies of the S44 measurement. Unless you have the NVNA (X-Parameter) option on your PNA-X, when making hot match measurements, you have to offset the source frequencies from the S-Parameter frequencies so that the output signal of the amplifier does not fall within the same bandwidth as the small signal S-Parameter measurement. The attached power point is part of a workshop we gave at a conference and describes the proper way to setup a Hot S-Parameter measurement on the PNA-X (which I also assume is the VNA you are using). Of course if all these assumptions are incorrect, then you'll need to provide a little more detail about your measurement setup in order for us to be able to comment about the spikes. 附件 Hot S22 Measurements.pptx491.5 KB

2018-10-22 16:22:40 评论举报刘华湘

答案对人有帮助，有参考价值 0 关闭校准（取消选择校准集）并查看迹线的外观。如果尖峰消失，它们就是校准伪像。如果它们仍然存在，则它们是测量工件或DUT工件。如果您正在尝试进行热测量，请勾勒出您的测量和连接以及您要测量的内容。以上来自于谷歌翻译以下为原文 Turn off calibration (unselect the cal set) and see what the trace looks like. If the spikes go away they are a calibration artifact. If they remain they are a measurement artifact, or a DUT artifact. If you are trying to do a hot measurement, sketch out your dut and connections and what you are trying to measure.

2018-10-22 16:41:51 评论举报孔德羲