ieee 1149.1标准pdf

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ieee 1149.1标准pdf

IEEE Std 1149.1-2001
(Revision of IEEE Std 1149.1-1990)
IEEE Standard Test Access Port and
Boundary-Scan Architecture
Sponsor
Test Technology Standards Committee
of the
IEEE Computer Society
Approved 14 June 2001
IEEE-SA Standards Board
Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
support of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
including a boundary-scan register, such that the component is able to respond to a minimum set
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language
is defined that allows rigorous description of the component-specific aspects of such testability
features.
Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,
boundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
TAP, test, test access port, VHDL, VHSIC Hardware Description Language

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