<p><font face="Verdana"><font face="Verdana">ieee 1149.1标准pdf</font><br/></font></p>
<p><font face="Verdana"><font face="Verdana">IEEE Std 1149.1-2001<br/>(Revision of IEEE Std 1149.1-1990)<br/>IEEE Standard Test Access Port and<br/>Boundary-Scan Architecture<br/>Sponsor<br/>Test Technology Standards Committee<br/>of the<br/>IEEE Computer Society<br/>Approved 14 June 2001<br/>IEEE-SA Standards Board<br/>Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and<br/>support of assemb
LED printed circuit boards is defined. The circuitry includes a standard inte
RFace<br/>through which instruc
tions and test data are communicated. A set of test features is defined,<br/>including a boundary-scan register, such that the component is able to respond to a minimum set<br/>of instructions designed to assist with testing of assembled printed circuit boards. Also, a language<br/>is defined that allows rigorous description of the component-specific aspects of such testability<br/>features.<br/>Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,<br/>boundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,<br/>TAP, test, test access port, VHDL, VHSIC Hardware Description Language</font></p></font><br/>
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