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王华

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[问答]

F28377D test connection成功 但无法debug连接dsp

[Start: Spectrum Digital XDS560V2 STM USBEmulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f%boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:UsersYISENAppDataLocalTEXASI~1CCS
   ti3BrdDattestBoard.dat
-----[Print the reset-command softwarelog-file]-----------------------------
This utility has selected a 560/2xx-classproduct.
This utility will load the program'sd560v2u.out'.
The library build date was 'Apr 30 2019'.
The library build time was '11:41:17'.
The library package version is'8.1.0.00012'.
The library component version is'35.35.0.0'.
The controller does not use a programmableFPGA.
The controller has a version number of '6'(0x00000006).
The controller has an insertion length of'0' (0x00000000).
The cable+pod has a version number of '8'(0x00000008).
The cable+pod has a capability number of'7423' (0x00001cff).
This utility will attempt to reset thecontroller.
This utility has successfully reset thecontroller.
-----[Print the reset-command hardwarelog-file]-----------------------------
The scan-path will be reset by toggling theJTAG TRST signal.
The controller is the Nano-TBC VHDL.
The link is a 560-classsecond-generation-560 cable.
The software is configured for Nano-TBCVHDL features.
The controller will be software reset viaits registers.
The controller has a logic ONE on itsEMU[0] input pin.
The controller has a logic ONE on itsEMU[1] input pin.
The controller will use falling-edge timingon output pins.
The controller cannot control the timing oninput pins.
The scan-path link-delay has been set toexactly '2' (0x0002).
The utility logic has not previouslydetected a power-loss.
The utility logic is not currentlydetecting a power-loss.
-----[The log-file for the JTAG TCLK outputgenerated from the PLL]----------
Test  Size   Coord     MHz    Flag  Result      Description
~~~~  ~~~~  ~~~~~~~ ~~~~~~~~  ~~~~  ~~~~~~~~~~~ ~~~~~~~~~~~~~~~~~~~
   1   none  - 01 00 500.0kHz   -    similar     isit internal clock
   2   none  - 01 09 570.3kHz   -    similar     isit internal clock
   3     64  - 01 00 500.0kHz   O    good value  measure path length
   4     16  - 01 00 500.0kHz   O    goodvalue   auto step initial
   5     16  - 01 0D 601.6kHz   O    good value  auto step delta
   6     16  - 01 1C 718.8kHz   O    good value  auto step delta
   7     16  - 01 2E 859.4kHz   O    good value  auto step delta
   8     16  + 00 02 1.031MHz   O    good value  auto step delta
   9     16  + 00 0F 1.234MHz   O    good value  auto step delta
  10     16  + 00 1F 1.484MHz   O    good value  auto step delta
  11     16  + 00 32 1.781MHz   O    good value  auto step delta
   12     16 + 01 04  2.125MHz   O   good value   auto step delta
  13     16  + 01 11 2.531MHz   O    good value  auto step delta
  14     16  + 01 21 3.031MHz   O    good value  auto step delta
  15     16  + 01 34 3.625MHz   O    good value  auto step delta
  16     16  + 02 05 4.313MHz   O    good value  auto step delta
  17     16  + 02 13 5.188MHz   O    good value  auto step delta
  18     16  + 02 23 6.188MHz   O    good value  auto step delta
  19     16  + 02 37 7.438MHz   O    good value  auto step delta
  20     16  + 03 07 8.875MHz   O    good value  auto step delta
  21     16  + 03 15 10.63MHz   O    good value  auto step delta
  22     16  + 03 1E 11.75MHz  {O}   good value  auto step delta
  23     64  + 02 3E 7.875MHz   O    good value  auto power initial
  24     64  + 03 0E 9.750MHz   O    good value  auto power delta
  25     64  + 03 16 10.75MHz   O    good value  auto power delta
  26     64  + 03 1A 11.25MHz   O    good value  auto power delta
  27     64  + 03 1C 11.50MHz   O    good value  auto power delta
  28     64  + 03 1D 11.63MHz   O    good value  auto power delta
  29     64  + 03 1D 11.63MHz   O    good value  auto power delta
  30     64  + 03 13 10.38MHz  {O}   good value  auto margin initial
The first internal/external clock testresuts are:
The expect frequency was 500000Hz.
The actual frequency was 499110Hz.
The delta frequency was 890Hz.
The second internal/external clock testresuts are:
The expect frequency was 570312Hz.
The actual frequency was 569976Hz.
The delta frequency was 336Hz.
In the scan-path tests:
The test length was 2048 bits.
The JTAG IR length was 6 bits.
The JTAG DR length was 1 bits.
The IR/DR scan-path tests used 30frequencies.
The IR/DR scan-path tests used 500.0kHz asthe initial frequency.
The IR/DR scan-path tests used 11.75MHz asthe highest frequency.
The IR/DR scan-path tests used 10.38MHz asthe final frequency.
-----[Measure the source and frequency ofthe final JTAG TCLKR input]--------
The frequency of the JTAG TCLKR input ismeasured as 10.37MHz.
The frequency of the JTAG TCLKR input andTCLKO output signals are similar.
The target system likely uses the TCLKOoutput from the emulator PLL.
-----[Perform the standard path-length teston the JTAG IR and DR]-----------
This path-length test uses blocks of 6432-bit words.
The test for the JTAG IR instructionpath-length succeeded.
The JTAG IR instruction path-length is 6bits.
The test for the JTAG DR bypass path-lengthsucceeded.
The JTAG DR bypass path-length is 1 bits.
-----[Perform the Integrity scan-test onthe JTAG IR]------------------------
This test will use blocks of 64 32-bitwords.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test hassucceeded.
-----[Perform the Integrity scan-test onthe JTAG DR]------------------------
This test will use blocks of 64 32-bitwords.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test hassucceeded.
[End: Spectrum Digital XDS560V2 STM USBEmulator_0]

这是test connection的结果
但进入debug后点击connect target就跳出图片对话框,驱动也是正常的,这个问题折磨我一个星期了,希望大家指导一下

  • 1605601491(1).png

回帖(1)

祝祯梁

2022-11-14 10:55:19
楼主解决了吗,遇到了同样的问题
举报

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