Hi Zhangjie,
抱歉，您这个问题涵盖面比较广啊...
针对TMS570系列产品，我们有一个非常好的文档:
Safety Manual for Hercules™ TMS570LS20x/10x ARM® Safety Critical Microcontrollers
www.ti.com/.../spnu507.pdf
建议您阅读这份文档。
这份文档中给出了一些常见的使用方法，如:
CPU 自检:
The LBIST tests must be triggered by software. User may elect to run all tests, or only a subset of the
tests based on the execution time, which can be allocated to the LBIST diagnostic. This time sliced test
feature enables the LBIST to be used effectively as a runtime diagnostic with execution of test time slices
per safety critical loop as well as a comprehensive test for CPU fault during MCU initialization.
Memory PBIST自检:
The PBIST tests must be triggered by the software. User can elect to run all algorithms, or only a subset
of the algorithms based on the execution time that can be allocated to the PBIST diagnostic. Similarly, the
user can elect to run the PBIST on one SRAM or on groups of SRAMs based on the execution time,
which can be allocated to the PBIST diagnostic. The PBIST tests are destructive to memory contents, and
as such are typically run only at MCU initialization. However, the user has the freedom to initiate the tests
at any time when the CPU is operable.
Hi Zhangjie,
抱歉，您这个问题涵盖面比较广啊...
针对TMS570系列产品，我们有一个非常好的文档:
Safety Manual for Hercules™ TMS570LS20x/10x ARM® Safety Critical Microcontrollers
www.ti.com/.../spnu507.pdf
建议您阅读这份文档。
这份文档中给出了一些常见的使用方法，如:
CPU 自检:
The LBIST tests must be triggered by software. User may elect to run all tests, or only a subset of the
tests based on the execution time, which can be allocated to the LBIST diagnostic. This time sliced test
feature enables the LBIST to be used effectively as a runtime diagnostic with execution of test time slices
per safety critical loop as well as a comprehensive test for CPU fault during MCU initialization.
Memory PBIST自检:
The PBIST tests must be triggered by the software. User can elect to run all algorithms, or only a subset
of the algorithms based on the execution time that can be allocated to the PBIST diagnostic. Similarly, the
user can elect to run the PBIST on one SRAM or on groups of SRAMs based on the execution time,
which can be allocated to the PBIST diagnostic. The PBIST tests are destructive to memory contents, and
as such are typically run only at MCU initialization. However, the user has the freedom to initiate the tests
at any time when the CPU is operable.
举报
