你好。我用 i.MX8m plus 制作了一个定制板。
我通过 RPA v9 制作 .ds 文件,并在 NXP i.MX/Mscale DDR Tool V3.31 上进行压力测试。
============ Step 3: DDR parameters processing... ============
[Result] Done
Success: DDR Calibra
tion completed!!!
DDR Stress Test Iteration 1
--------------------------------
--Running DDR test on region 1--
--------------------------------
t0.1: data is addr test
....
t0.2: row hop read test
...
t1: memcpy SSN armv8_x32 test
.Address of test1 failure: 0x00000000800022C8
Data was: 0xFF7FFFFF02000000
But pattern was: 0xFFFFFFFF02000000
我的硬件设计团队制作了与 NXP LPDDR4 EVK 相同的 LPDDR4
电路。这是它的一部分。
我还附上了 RPA xlsx。
无论如何,我继续制作 u-boot 源代码,并使用 memtester 在内核提示符下进行测试。
root@(none):~# ./memtester 100 1
memtester version 4.3.0 (32-bit)
Copyright (C) 2001-2012 Charles Cazabon.
Licensed under the GNU General Public License version 2 (only).
pagesize is 4096
pagesizemask is 0xfffff000
want 100MB (104857600 bytes)
got 100MB (104857600 bytes), trying mlock ...locked.
Loop 1/1:
Stuck Address : testing 15FAILURE: possible bad address line at offset 0x05985f88.
Skipping to next test...
Random Value : ok
Compare XOR : ok
Compare SUB : ok
Compare MUL : ok
Compare DIV : ok
Compare OR : ok
Compare AND : ok
Sequential Increment: ok
Solid Bits : testing 3FAILURE: 0xffffffff != 0xff7fffff at offset 0x000b9504.
Block Sequential : ok
Checkerboard : ok
Bit Spread : ok
Bit Flip : testing 90FAILURE: 0xff7ff7ff != 0xfffff7ff at offset 0x031e4b48.
Walking Ones : ok
Walking Zeroes : ok
8-bit Writes : ok
16-bit Writes : ok
Done
结果与上面的压力测试类似。
你能告诉我一些解决方案或我应该检查哪一点吗?