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李宏

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如何将测量平面移至设备平面?

大家好日子。
这是我的第一篇文章,我非常需要你的帮助。
对于我的项目,我想测量DUT的S11和S21。
我的DUT是各种薄片材料,大约2x2cm,厚度为0.1cm,夹在两个矩形波导之间。
我有2个VNA供我使用。
1. Agilent E5070B 2. Advantest R3767CG。
为了仅测量DUT(不包括波导)的S11和S21,我需要将测量平面移动到器件平面。
如附图所示。
我在谷歌上做了很多阅读,谷歌搜索的结果并不详细和令人满意,或者它们对我的理解太过提前了。
根据Rohde& Sons的应用报告。
Schwarz关于“介电材料特性的测量”,这可以通过调整电气长度或使用大多数vna中存在的去嵌入功能来完成。
我无法在我的两个vna的手册中找到关于“去嵌入”功能的任何内容,但我发现我有电子延迟功能。
可悲的是,我不知道如何计算所需的延迟。
如何计算所需的电气长度校正以排除波导的影响?
请帮助我,任何帮助将深表感谢。

以上来自于谷歌翻译


     以下为原文

  Good day to everyone.

This is my first post and i greatly need your help.
For my project, i would like to measure the S11 and S21 of a DUT.
my DUT, are various thin pieces of material, approximately 2x2cm, and 0.1cm thick will be sandwich between two rectangular waveguides.

i have 2 VNA at my disposal.  
1. Agilent E5070B  
2. Advantest R3767CG.

In order to measure the S11 and S21 of ONLY the DUT (excluding the waveguides)
i need to shift the measurement plane to the device plane.
as shown in the attached picture.

I've done lots of reading in google, and the googled results are not detail and satisfactory, or maybe they are too advance for my understanding.

According to an application note by Rohde& Schwarz on "measurement of dielectric material propertiess", this can be done by  
-adjusting the electrical length or  
-using the de-embedding function present in most vna.

I cant find anything about "de-embedding" feature in the manual of my both vna, but i found out that i have the electrical delay function. Sadly, i have no idea how to calculate the delay required.

How can i calculate the required electrical length correction to exclude the effects of the waveguides?
Please help me, any help will be deeply appreciated.   
附件

回帖(3)

孔德羲

2019-10-16 10:50:22
我同意,R& S和Advantest在帮助方面毫无价值(哦,我说过了吗?抱歉,我马上道歉)。
您需要的是一种自动将端口的电参考平面扩展到被测设备(DUT)参考平面的方法。
幸运的是,在ENA(和PNA)中有一种称为“自动端口扩展”的新方法就是这样做的。
这是基本手册的链接:http://cp.literature.agilent.com/litweb/pdf/5988-3765EN.pdf这是一个链接到更多关于端口扩展的信息(基于PNA,但信息是相关的
任何VNA):http://na.tm.agilent.com/pna/help/latest/S3_Cals/Port_Extensions.htm这是另一个链接,了解更多详情:http://mwrf.com/Articles/Index.cfm?ArticleID =
18931& pg = 2这里有一个包含所有细节的链接http://www.google.com/patents/US7088087希望它有所帮助。

以上来自于谷歌翻译


     以下为原文

  I agree, R&S and Advantest are pretty worthless when it comes to helping out (oh, did I say that?  Sorry, I immediately apologize). what you need is a way to automatically extend the ports' electrical reference plane to the reference plane of the Device Under Test (DUT).

Fortunately, there is a brilliant new method in the ENA (and PNA) called "Automatic Port Extension" that does exactly that.

Here's a link to the basic brochure:  http://cp.literature.agilent.com/litweb/pdf/5988-3765EN.pdf

Here's a link to more info on port extensions (based on the PNA, but the information is relavent to any VNA): http://na.tm.agilent.com/pna/help/latest/S3_Cals/Port_Extensions.htm
Here's another link for more details:
http://mwrf.com/Articles/Index.cfm?ArticleID=18931&pg=2
And here's a link with all the details
http://www.google.com/patents/US7088087

Hope it helps.
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李宏

2019-10-16 10:58:08
引用: 脑洞大赛9 发表于 2019-10-16 12:41
我同意,R& S和Advantest在帮助方面毫无价值(哦,我说过了吗?抱歉,我马上道歉)。
您需要的是一种自动将端口的电参考平面扩展到被测设备(DUT)参考平面的方法。
幸运的是,在ENA(和PNA)中有一种称为“自动端口扩展”的新方法就是这样做的。

在我进行端口扩展之前,我需要先做校准吗?
我使用的VNA相当陈旧,E5070B 300k-3GHz在哪里可以找到这个型号的说明?
我对此型号没有ecal或校准标准。
我能用TRL校准来定义自己吗?
我可以将我的夹具作为直通,将它作为反射保持打开,并在一条线之间连接一个随机物品,vna将为我自动校准。
这么简单吗?
或者是否涉及其他步骤?
在您的宣传册链接http://cp.literature.agilent.com/litweb/pdf/5988-3765EN.pdf中提到了校准向导,但我无法找到启动它的方法。
我可以在哪里推出它?
编辑:我发现这个指南http://www.icmicrowave.com/pdf/ENA_Multiport_TRL_LRM_manual.pdf我已经下载并安装了里面描述的程序。
运行后,我需要手动输入我的TRL标准的详细信息。
这是akward,我以为我能够直接衡量标准,我不知道每个标准的延迟编辑:mtxx于2012年6月23日上午6:37编辑:mtxx于2012年6月23日上午6:48

以上来自于谷歌翻译


     以下为原文

  Before i do port extention, i need to do calibration first right?

The VNA i'm using is fairly old, a E5070B 300k-3GHz
where can i find the instructions for this model?

i do not have ecal or calibration standards for this model.
can i define myself using TRL calibration?

can i short my fixture as thru, leave it open as reflect, and connect a random item between as line,
and the vna will auto cal for me. is it that simple? or are there additional steps involved?

in your brochure link,
http://cp.literature.agilent.com/litweb/pdf/5988-3765EN.pdf
it mention about a calibration wizard, but i cant find a way to start it. where can i launch it?


edit:
i found this guide http://www.icmicrowave.com/pdf/ENA_Multiport_TRL_LRM_manual.pdf
i've downloaded and installed the program described inside.
after running it, i need to input the details of my TRL standards manually. this is akward, i thought i am able to measure the standards directly, i do not know the delays of each my standards

Edited by: mtxx on Jun 23, 2012 6:37 AM

Edited by: mtxx on Jun 23, 2012 6:48 AM
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孔德羲

2019-10-16 11:04:57
引用: csyyyyy 发表于 2019-10-16 12:49
在我进行端口扩展之前,我需要先做校准吗?
我使用的VNA相当陈旧,E5070B 300k-3GHz在哪里可以找到这个型号的说明?
我对此型号没有ecal或校准标准。

我不记得旧型号ENA-B是否支持TRL作为原生模式或VBA,但如果你有TRL支持,并且你正在使用波导,那么很容易得到一个校准套件。
1)使用短路作为反射(TRL中的R)2)使用直通(直接连接)作为TRL中的T 3)使用1/4垫片(波导的长度约为波导最宽的1/2)
作为线。
在您的DUT的波导处进行此操作,您不需要进行任何端口扩展或去嵌入。

以上来自于谷歌翻译


     以下为原文

  I don't remember if older model ENA-B support TRL as native mode or as a VBA, but if you have TRL support, and you are using waveguide, it is very easy to get a cal kit.

1) use short as the reflect (R in TRL)
2) use a thru (direct connection) as the T in TRL
3) use a 1/4 shim (waveguide whose length is about 1/2 the widest dimension of the waveguide) as the line.

Do this at the waveguide intefact to your DUT and you don't need to do any port extension or de-embedding.
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