嗨Sharaf,校准程序在N4375B用户指南的第6章中有所描述。
通常,顺序是首先选择扫描参数,如开始和停止频率等。然后进行电气校准。
由于N4375B内部通过开关路由RF功率,因此有第6章所述的用于进行校准的特殊连接。完成此校准后,可以启动所需LCA测量的宏(OE,EO或OO)
。
这将包括LCA发射器和/或接收器的适当校准数据。
它还允许为任何其他适配器进行额外的重新嵌入。
LCA测量OE的光学到电学转换的频率依赖性或EO测量的电学到光学的频率依赖性,包括器件的电侧的RF反射。
对于OO测量,通常进行用户校准以表示零插入损耗。
然后可以插入光学装置,结果给出了调制到光学载体上的RF信号的衰减。
由于结果以dBe给出,例如3dBo的光衰减将使S21结果减少6dBe。
如果设备没有一些过滤功能,通常不会有明显的频率依赖性。
(多模光纤,可以使用N4376D测量,由于差模分散,可能会显示带宽限制。)除了用户指南之外,本应用笔记还对测量原理有了很好的概述。
http://literature.cdn.keysight.com/litweb/pdf/5989-7808EN.pdf
以上来自于谷歌翻译
以下为原文
Hi Sharaf,
The calibration procedure is described in Chapter 6 of the User Guide for the N4375B.
In general, the sequence is to first select the sweep parameters, like start and stop frequency etc.
Then an electrical calibration is made. Since the N4375B routes the RF power internally with switches, there are special connections for making the calibration, as described in Chapter 6.
After this calibration is finished, the macro for the desired LCA measurement, (OE, EO or OO) can be started. This will include the appropriate calibration data for the LCA transmitter and/or receiver. It also allows additional deembedding for any other adapters.
The LCA measures the frequency dependence of the optical to electrical conversion for OE or electrical to optical for EO measurements, including the RF reflection of the electrical side of the device.
For OO measurement, a user calibration is usually made to represent zero insertion loss. Then an optical device can be inserted and the result gives the attenuation of the RF signal that is modulated onto the optical carrier. Since the results are given in dBe, an optical attenuation of 3dBo for example, will give 6dBe reduction of the S21 result. If the device does not have some filtering function there will usually not be significant frequency dependence. (Multimode fibers, which can be measured with the N4376D, can show bandwidth limitations due to differential mode dispersion.)
Besides the User Guide, this application note gives a good overview of the measurement principles.
http://literature.cdn.keysight.com/litweb/pdf/5989-7808EN.pdf
嗨Sharaf,校准程序在N4375B用户指南的第6章中有所描述。
通常,顺序是首先选择扫描参数,如开始和停止频率等。然后进行电气校准。
由于N4375B内部通过开关路由RF功率,因此有第6章所述的用于进行校准的特殊连接。完成此校准后,可以启动所需LCA测量的宏(OE,EO或OO)
。
这将包括LCA发射器和/或接收器的适当校准数据。
它还允许为任何其他适配器进行额外的重新嵌入。
LCA测量OE的光学到电学转换的频率依赖性或EO测量的电学到光学的频率依赖性,包括器件的电侧的RF反射。
对于OO测量,通常进行用户校准以表示零插入损耗。
然后可以插入光学装置,结果给出了调制到光学载体上的RF信号的衰减。
由于结果以dBe给出,例如3dBo的光衰减将使S21结果减少6dBe。
如果设备没有一些过滤功能,通常不会有明显的频率依赖性。
(多模光纤,可以使用N4376D测量,由于差模分散,可能会显示带宽限制。)除了用户指南之外,本应用笔记还对测量原理有了很好的概述。
http://literature.cdn.keysight.com/litweb/pdf/5989-7808EN.pdf
以上来自于谷歌翻译
以下为原文
Hi Sharaf,
The calibration procedure is described in Chapter 6 of the User Guide for the N4375B.
In general, the sequence is to first select the sweep parameters, like start and stop frequency etc.
Then an electrical calibration is made. Since the N4375B routes the RF power internally with switches, there are special connections for making the calibration, as described in Chapter 6.
After this calibration is finished, the macro for the desired LCA measurement, (OE, EO or OO) can be started. This will include the appropriate calibration data for the LCA transmitter and/or receiver. It also allows additional deembedding for any other adapters.
The LCA measures the frequency dependence of the optical to electrical conversion for OE or electrical to optical for EO measurements, including the RF reflection of the electrical side of the device.
For OO measurement, a user calibration is usually made to represent zero insertion loss. Then an optical device can be inserted and the result gives the attenuation of the RF signal that is modulated onto the optical carrier. Since the results are given in dBe, an optical attenuation of 3dBo for example, will give 6dBe reduction of the S21 result. If the device does not have some filtering function there will usually not be significant frequency dependence. (Multimode fibers, which can be measured with the N4376D, can show bandwidth limitations due to differential mode dispersion.)
Besides the User Guide, this application note gives a good overview of the measurement principles.
http://literature.cdn.keysight.com/litweb/pdf/5989-7808EN.pdf
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