嗨,
我和LIS331DLH有类似的问题。当我们启用ST模式时,更改略高于规格。
从传感器接收的XYZ值除以16(这使16位 - > 12位移位并保持+/-符号正确)。
如果我们使用数据表中提到的规格,传感器都不会通过测试。
看起来如果我们改变16位 - > 11位然后自测试读数通常是数据表中定义的值。
致ST:您能否确认XYZ值应该如何处理,或者您是否有任何执行自检的示例源代码,结果应该是PASS?
BR
杰瑞
以上来自于谷歌翻译
以下为原文
Hi,
I have similar issues with the LIS331DLH. When we enable the ST mode changes are slightly over the specs.
XYZ values received from the sensor are divided by 16 (this shifts 16bit->12bit and keeps +/- sign correct).
If we use specs mentioned in the datasheet none of sensor will pass the test.
It looks that if we shift 16bit -> 11bit then self test readings are as typically vales defined in the datasheet.
To ST: Could you please confirm how XYZ values should handle or do you have any example source code where the self-test is executed and result should be PASS?
BR
Jari
嗨,
我和LIS331DLH有类似的问题。当我们启用ST模式时,更改略高于规格。
从传感器接收的XYZ值除以16(这使16位 - > 12位移位并保持+/-符号正确)。
如果我们使用数据表中提到的规格,传感器都不会通过测试。
看起来如果我们改变16位 - > 11位然后自测试读数通常是数据表中定义的值。
致ST:您能否确认XYZ值应该如何处理,或者您是否有任何执行自检的示例源代码,结果应该是PASS?
BR
杰瑞
以上来自于谷歌翻译
以下为原文
Hi,
I have similar issues with the LIS331DLH. When we enable the ST mode changes are slightly over the specs.
XYZ values received from the sensor are divided by 16 (this shifts 16bit->12bit and keeps +/- sign correct).
If we use specs mentioned in the datasheet none of sensor will pass the test.
It looks that if we shift 16bit -> 11bit then self test readings are as typically vales defined in the datasheet.
To ST: Could you please confirm how XYZ values should handle or do you have any example source code where the self-test is executed and result should be PASS?
BR
Jari
举报