求助JTAG错误，不知道什么问题

Peng 你好，
你的板子之前有成功调试过吗？
1. 首先在Target Configuration里测试一下板子与CCS的连接是否正常。
2. 如果只是在debug时出现该错误，你可以尝试下面的方法：
使用Nowflash擦除或下载程序，首先按住RESET按键，然后开始使用Nowflash擦除或下载程序，当看到“Connecting”时，松开RESET按键。观察是否能够擦除或下载成功。

谢谢，在前几版上都调试过的，这次是新做的板子，原理和以前的一样，就是焊接厂家不一样了，我怀疑是焊接问题引起的，等我下周试试你的方法。

你好，我们用的是ccsv5.5版本，找不到nowflash。
再请教个问题，调试时最好的方法是下载到ram里面运行，还是每次都烧写到flash里面去呢？每次烧写flash时，时间有点长。

Peng, 你好
旧的版本常用nowflash下载程序，现在统一改用Uniflash了。
不同MCU默认烧写位置是不同的。对于Hercules产品，在CCS中调试时，程序默认每次都是烧写到片上flash里面的，运行也是在flash中，除非你使用memcpy将其copy到RAM中运行。在.cmd文件中，你可以找到相应文件的存储位置。
   .text  > FLASH0   .const > FLASH0   .cinit > FLASH0   .pinit > FLASH0   .data  > SRAM   .bss   > SRAM

你好，JTAG通过Target Configuration测试是连接正确的，就一定可以下载程序吗？如下打印的信息。

[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]

-----[Print the board config pathname(s)]------------------------------------
C:UsersADMINI~1AppDataLocal.TI2685331358
0BrdDattestBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesu***.dll'.
The library build date was 'Aug 20 2013'.
The library build time was '22:56:19'.
The library package version is '5.1.232.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 6 bits.
The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.

xds100没什么致命的连接错误，一般都轻松测过，所以只做参考用

你好，大侠，现在有个情况是这样的：
板子做回来后，下载我的测试代码可以无数次烧写到flash里面，而交给软件开发人员后，下载他的程序后，就会出现下面的错误，中间也换了不少芯片，现在被软件开发人员的程序搞坏的芯片差不多有十片了，都是我这里无数次烧写，到软件那里就烧写一次后就无法烧写第二次了，我怀疑是软件的程序把内部flash被锁死了，硬件原理图已经经过好几轮的验证了，没有问题的。

Error connecting to the target:
(Error -2062 @ 0x0)
Unable to halt device. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
(Emulation package 5.1.232.0)

谢谢你，这个问题在美国的TI技术支持下解决了

Peng 你好，
非常感谢你对TI在线社区的支持，若问题解决了，麻烦结贴。另外，请问你能将你最终的解决方案跟大家分享一下吗？谢谢。

可能是焊接的问题，如果原理图没有修改过，只能是焊接的问题了